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Case Studies on Depth Analysis of Multilayer Films by ESCA

Case Studies on Depth Analysis of Multilayer Films by ESCA

Publication of depth analysis results of multilayer films using an electron spectroscopy for chemical analysis (ESCA) device!

This case study collection presents examples of depth analysis of multilayer films using the photoelectron spectroscopy device "ESCA" from Ion Tech Center Co., Ltd., which provides services such as ion implantation, film formation and analysis, and research and commercialization management. The results of analyzing a stacked film of silicon oxide and titanium oxide on a silicon substrate using ESCA (Quantum-2000) are included. [Overview of Publication] ■Analysis results of depth analysis of multilayer films using ESCA *For more details, please refer to the catalog or feel free to contact us.

  • Other contract services
  • Other services
  • others
  • Photoelectron Spectroscopy

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<PDF Data Download Available> [XPS] Contamination Analysis of Polyimide Surfaces Using XPS

<PDF Data Download Available> [XPS] Contamination Analysis of Polyimide Surfaces Using XPS

X-ray photoelectron spectroscopy (XPS) is ideal for analyzing surface contamination, discoloration, and other evaluations because it provides elemental information from the outermost surface of the sample (a few nm).

A defect occurred where the surface of the polyimide film became hydrophobic, but due to the depth of information obtained from SEM/EDX analysis, the specific elements present on the very surface could not be detected. Therefore, we conducted surface analysis using X-ray photoelectron spectroscopy (XPS), which is a surface-sensitive method. In this case, we will introduce "Surface Contamination Analysis of Polyimide by XPS." Please take a moment to read the PDF materials. Additionally, our company conducts various surface analyses including GD-OES and Auger, in addition to this WPS. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request through the inquiry button, we will send them to you.

  • Contract Analysis
  • Other polymer materials
  • Surface treatment contract service
  • Photoelectron Spectroscopy

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X-ray photoelectron spectroscopy (XPS) analysis

X-ray photoelectron spectroscopy (XPS) analysis

Soft X-ray irradiation! Ideal for qualitative and semi-quantitative analysis of substrates and circuits using photoelectron spectroscopy!

"X-ray photoelectron spectroscopy (XPS) analysis" involves irradiating the sample surface with soft X-rays and measuring the binding energy of the emitted photoelectrons. It allows for the examination of the elements and composition of the sample (qualitative and semi-quantitative analysis) as well as the chemical states of the elements (state analysis). The information detected pertains to the extreme surface layer of the sample (a few nanometers), and by combining it with Ar ion sputtering, depth profiling measurements can also be conducted. Since the excitation source is soft X-rays, it is possible to measure samples that are non-conductive. [Applicable Targets] ■ Metals in general ■ Ceramics ■ Semiconductors ■ Thin films ■ Films *For more details, please refer to the catalog or feel free to contact us.

  • Analytical Equipment and Devices
  • Photoelectron Spectroscopy

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